Showing results: 31 - 43 of 43 items found.
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HI-903 -
Metrix
This is our top of the line Hardy Shaker. It provides the ability to set the amplitude and change the frequency range without the amplitude changing. This automation makes conducting vibration tests easier. Tests can be conducted on multiple vibration transducers, and then the saved data can be transferred via USB Flash Drive to be displayed in an automated and customizable report using an Excel template on your computer. In manual mode, the vibration test level and test frequency can be set from 7 Hz to 10,000 Hz. The high accuracy instrument can display the vibration level in terms of g’s peak, velocity peak (in/sec or mm/s) or displacement peak-to-peak (mils or µm). The unit can support payloads up to 800 grams (see frequency limits in the manual). A built-in display reads the output sensitivity, which can be stored in memory. Complete testing sequences and data can be stored in memory for each tested sensor, the unit logs the data on the spot or stores it for later use. For testing of heavy transducers or at high frequencies, the HI-903 automatically corrects the sensitivity calculation for the effects of transducer mass loading. A built-in self-test program checks for accuracy of all calculations. The HI-903 has a built-in battery charger that can operate on 120 or 240 VAC. The unit comes in a rugged Pelican case.
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JSCAN -
Navatek Engineering Corp.
JSCAN lets you view and control JTAG pins in real-time without having to touch your board! With a simple click of your mouse, you can set pins HIGH or LOW and observe the results right on your PC.J-SCAN works independently of any logic inside the JTAG device, you do not need any special firmware, code or logic installed. View and control pins in real-time, program FLASH memories, create test macros, for system test, easy to use graphical interface and affordable.
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S-102 -
Notice
The EDFA slot module of FOTS system with built-in power booster EDFA module offers a special function that is able to change the optical signal amplification feature variously, which is followed by user’s driving embedded pump LD freely. The output power of eash pump LD can be controlled separately by the program that is set up by user. When an optimum optical signal amplification particularity is needed, it is made up so that it can be materialized by choosing the Default mode provided along with User mode. More stable application of EDFA is possible through the monitoring of the factors such as in/out signal power, gain, alarm status and pump LD enabled by the application of FPGA processor which makes high speed driving possible. It is also set up that user’s present-time monitoring and control through LCD monitor of system main frame or GUI display for remote control can be possible. Through optimization of amplifier gain, noise figure, and saturated output power, this EDFA module will expand test capabilities in systems, components or sub-assembly manufacturing.
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eBIRST -
Pickering Interfaces Ltd.
The eBIRST toolset consists of three different tools that support 200-pin LFH, 78-pin and 50-pin connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence. These tools work by measuring the path resistance at the switching system external connectors using four-wire measurements, quickly establishing whether the path is good, has increased resistance or has failed. Below are links to various eBIRST tool information:
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EasyTest 2.0 -
Acery Technologies
EasyTest © 2.0 is a set of common test automation software platform, with the definition of test engineering, test process editor, test program generation, test execution process, test data on a network share as one of the functions. Using EasyTest © 2.0 can easily set up a large network systems and ground test integrated test system, you can build standalone automatic test system, or automatic control equipment R & D engineers, and other data stored for use in research and development.
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GX3788 -
Marvin Test Solutions, Inc.
The GX3788 is a user configurable, FPGA-based, 3U PXI multi-function card which supports digital and analog test capabilities. The card employs the Altera Stratix III FPGA which features over 45,000 logic elements and 1.836 Kb of memory. The GX3788 is based on the GX3700 FPGA card and includes an integral daughter board which provides (8) differential input, 16-bit, 250 MS/s A to D converters and (8), 16-bit, 1 MS/s, D to A converters. The module's FPGA is pre-programmed, providing access to all digital and analog functions. Alternatively, users can program or modify the FPGA , allowing user to adapt the module to their own specific test needs. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Pickering Interfaces Ltd.
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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TPS Associates, Inc.
TPSA has over 20 years of experience in Engineering Design & Software Development including:Hardware & Software DesignOTPS Acquisition SupportSystems Installation & SupportAircraft Modification/CertificationEngineering Studies & AnalysesFunctional & Systems TestingIndependent Verification & Validation (IV & V)Test Program Set EngineeringReliability & Maintainability (R&M)Engineering Drawings & DataConfiguration Data ManagementReverse EngineeringRequirements AnalysisSupport Equipment (SE)Aircraft Launch & Recovery Engineering (ALRE)Engineering Change Proposal (ECP) ReviewTechnology Insertion (TI)PDR, CDR, FAT, Techeval, OSV Support
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MX-2 -
Dakota Ultrasonics
The MX-2 is ideal for the person that tests a few different materials regularly. The MX-2 contains 8 velocities of common materials and two velocities that the user can set using a simple sofware program. The tool's backlit display is easy to read, even in dim light, and the unit operates for up to 200 hours on a single set of batteries. The MX-2 comes complete, ready to use, and is protected by Dakota Ultrasonics 5 year limited warranty.
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National Technical Systems
NTS has a number of facilities capable of conducting dual shaker testing, vibration testing utilizing multiple electrodynamic exciters, for the evaluation of large payloads.Once such example was conducted as part of the test program for NASA’s Lunar Atmosphere and Dust Environment Explorer or LADEE. NTS worked with NASA’s Ames Research Center for simulated environmental testing of the LADEE observatory which included dual shaker vibration.Vibration testing on the observatory was conducted utilizing the NTS Santa Clarita facilities tandem Ling B-340 electrodynamic exciters. These exciters allow either dual shaker vibration testing, or in the case of the LADEE observatory tests, they minimize the test set-up time. The electrodynamic exciters were staged with one in the thrust axis and the other set-up for lateral axes vibration. This dual shaker set up allowed for a quick transition from one test to the other. During the tests, the vibration test lab was maintained at a class 10,000 cleanliness level.
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CodeReport -
Test Spectrum, Inc.
CodeReport is an easy-to-use application for verifying test program quality. CodeReport comes with many different, known quality screening rules that can be used to verify your test program is complete and ready for production. CodeReport also provides a graphical Rule Editor that allows you to create your own, custom rules. Ensure your coding standards and quality specifications are correct by generating your set of rules, checks, and screenings. Easily generate a detailed report for locating, correcting, and documenting the state of your test program. Quickly identify the tester hardware and instrumentation needed to run your program with the Tester Resource report. Save a session file to quickly return to your project after edits have been made or use the Session on other similar projects to transfer your configuration and custom rules.
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Focus-2005 -
Kyoritsu Testsystem Co., Ltd.
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
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PXIe-1149.5 -
Corelis, Inc.
The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
